X-ray powder diffractometer with optics for nanolayers and nanosurfaces
X-ray diffractometer equipped with optics for structure analysis of polycrystalline thin films and nanosurfaces.
- Academical usages: Diffraction
- Contact name: prof. RNDr. Pavla Čapková, DrSc.
- Contact email: pavla.capkova@ujep.cz
- Contact phone: +420 773 934 548
- Attachments: attachments/X-ray powder diffractometer with optics for nanolayers and nanosurfaces.docx