Secondary Ion Mass Spectrometer SIMS
Analytical equipment for surface analysis. Secondary Ion Mass Spectrometer equipped with two sources of ions. Cs ion gun and O2 ion gun (possible to switch to Ar)
- Academical usages: Analysis of thin films
- Contact name: Mgr. Jindřich Matoušek, Ph.D.
- Contact email: jindrich.matousek@ujep.cz
- Contact phone: +420 475 283 145
- Attachments: attachments/Secondary Ion Mass Spectrometer SIMS.docx