Atomic force microscope Integra

Atomic force microscopy system is useful for analysis of morphology and structure of nanomaterials in air and liquid environment with atomic resolution. It can be used in wide range of applications including the characterization of proteins, DNA, viruses, bacterial cells, tissues, surface morphology of nanostructured materials, local piezoelectric properties, local adhesion properties, magnetic domain structure visualization, polymer monocrystals, polymer nanoparticles, LB-films, thin organic films, nanopowders, nanocomposites, nanoporous materials, fullerenes, nanotubes, nanofilaments, nanocapsules and performing AFM and STM lithography.